Evolution 220 is fast and precise double beam geometry UV-VIS spectrophotometer with 1 nm spectral bandwidth precision. Our device is equipped with the Smart 8-Cell Peltier system for temperature control and sample monitoring from 0° to 100 °C.
Technical specifications:
- Baseline Flatness: ±0.0010A, 200-800nm, 1.0nm SBW, smoothing
- Data Interval: 10, 5, 2, 1.0, 0.5, 0.2, 0.1nm
- Detector Type: Dual Silicon Photodiodes
- Lamp: Xenon Flash Lamp
- Noise: 0A: <0.00015A; 1A: <0.00025A; 2A: <0.00080A; 260nm, 1nm SBW, RMS
- Scan Speed: <1 – 6000 nm/min, variable